BOTLAGUNTA PREETHISH NANDAN. AI-Powered Fault Detection In Semiconductor Fabrication: A Data-Centric Perspective. Kurdish Studies, [S. l.], v. 10, n. 2, p. 917–933, 2022. DOI: 10.53555/ks.v10i2.3854. Disponível em: https://kurdishstudies.net/menu-script/index.php/KS/article/view/3854. Acesso em: 11 sep. 2025.